Mahr-Marsurf XR 20- Profile roughness meter
Mahr-Marsurf XR 20- Profile roughness meter

The MarSurf XR 20 is Mahr's entry level system for top-of-the-line surface metering instruments. The computer-based instrument provides all common surface parameters and profiles according to international standards, both in the measuring chamber and in production.

The simple layout of ICONS and user-friendly user interface make this high-performance product very easy to use. MarSurf XR 20 is the result of decades of experience in surface metering and first-class leading technology.


  • Product parameters
  • 适用范围
  • 产品描述
  • 参数配置

The universal 'MarWin' measurement and evaluation software can accomplish the most diverse and wide range of measurement tasks, while ensuring its flexibility and upgradability to meet future needs


MarSurf XR 20

● More than 100 surface parameters in accordance with ISO/JIS, ASME or MOTIF (ISO 12085) standards are available for R-, P- and W profiles

● Tolerance monitoring and statistics for all surface parameters

● a teach-in method for quickly creating Quick&Easy measurement programs

● Comprehensive measurement record

● Automatic function to select filter and scan length according to standard

● Support various calibration methods (static/dynamic) by setting Ra or Rz parameters

● Adjustable maintenance and calibration intervals

● Quickly familiar with the operation principle of the simulation mode

● Multiple measuring station configurations can be used for custom applications

德国Mahr-MarSurf XR 20-轮廓粗糙度仪

德国Mahr-MarSurf XR 20-轮廓粗糙度仪

德国Mahr-MarSurf XR 20-轮廓粗糙度仪

德国Mahr-MarSurf XR 20-轮廓粗糙度仪

德国Mahr-MarSurf XR 20-轮廓粗糙度仪

Attachment:

● Parallel vice

●Low V block


General software options:

● MarWin main ripple option (WDc)

● ISO 13565-3 surface parameter options

● QS-STAT/QS-STAT Plus options

● Contouring options

● User - defined parameter options

● MarSurf XR 1 / XR 20 Option Outline 1

● All options are on an MLK (Mahr license key)


MarSurf XR 20
Measuring principleProbe method
The inputR probe, MFW 250 B
Measuring range mm

MFW 250: ±25 mm, ±250 mm, (up to ±750 mm)


±1000 inches, ±10,000 inches (up to ±30,000 inches)

 
Filters conform to ISO/JIS standardsISO 11562 standard Gaussian filtering, ISO 16610-21/ISO 16610-31 standard filtering
Scan length (text)

Automatically; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm*,

Measure to block, variable

* Scan length depends on driving device

The sampling length quantity conforms to ISO/JIS1 to 50 (default: 5)
Surface parametersMore than 100 surface parameters conforming to current ISO/JIS or MOTIF (ISO 12085) standards are available for R-, P-, and W profiles


The MarSurf XR 20 is Mahr's entry level system for top-of-the-line surface metering instruments. The computer-based instrument provides all common surface parameters and profiles according to international standards, both in the measuring chamber and in production.

The simple layout of ICONS and user-friendly user interface make this high-performance product very easy to use. MarSurf XR 20 is the result of decades of experience in surface metering and first-class leading technology.


upper ：Mahr-marsurf VD 140/280 profile roughness meter from Germanynext ：No Data

Relevant recommendations